I. Product Overview

The Micro Focus X-ray Source ABN-U180B is a high-precision, high-sensitivity non-destructive analytical instrument developed for material analysis and elemental detection.Adopting advanced XRF technology, it enables rapid and accurate elemental analysis and identification of a wide range of elemental compositions.Widely applied in environmental monitoring, mineral resources, metallic materials, electronic products and other fields, it is especially suitable for high-precision rapid testing and quality control.Benefiting from its non-destructive testing, fast analysis speed and high sensitivity, this X-ray fluorescence spectrometer delivers reliable analytical results and is ideal for testing mass batches of samples.

II. Product Features

Non-destructive analysis: XRF technology enables non-destructive testing of samples. Component analysis can be carried out without damaging samples, which is particularly critical for precious or non-renewable specimens.

Rapid analysis: XRF delivers fast testing speed. Full elemental analysis of samples can be completed within minutes, making it suitable for rapid quality control and on-site inspection.

Wide elemental detection range: It can detect a broad spectrum of elements ranging from light elements (such as sodium and magnesium) to heavy elements (such as uranium), covering most elements in the periodic table.

High sensitivity and accuracy: XRF technology boasts high sensitivity to trace elements at ppm levels with favorable accuracy, ideal for precise analytical tasks.

III. Technical Specifications

1. DetectorResolution: 2048 × 2048 pixels (CMOS Detector)Detection Area: 4.6 mm × 4.6 mm, suitable for high-resolution image analysisDetection Depth: 23.5 mm × 15.0 mm

2. Composition Analysis AccuracySpatial Analysis Precision: ≤ 2 μmComponent Measurement Precision: 0.5% (element concentration precision of test samples)

3. Scanning Speed & Analysis ModesScanning Speed: 2D imaging scan, ≤ 1 second per frame (fast scan mode)Composition Analysis Mode: 2D image analysis with rapid data processing, applicable to multi-element analysis

4. Sample StageMaximum Sample Size: 30 mm × 30 mmSupports various sample sizes and shapes to meet testing requirements of different materials

5. Data Output & FormatsOutput Formats: Compatible with STF, DICOM, JPEG and other file formatsData Interface: USB connection supported for convenient data transmission and storage

6. Temperature RangeSample Temperature Range: -196°C to 100°C (adaptable to various test environments)

7. Equipment Dimensions & Power ConsumptionOverall Dimensions: 650 mm (L) × 400 mm (W) × 550 mm (H)Power: This X-ray fluorescence spectrometer adopts low-power design with a maximum power consumption of 100 W

8. SafetySafety Design: Compliant with international safety standards and equipped with protective devices to guarantee operator safety during operation.

IV. Application Scenarios & Fields

1. Element composition and impurity analysis of semiconductors and electronic materials;

2. Composition testing of metals, alloys and coating materials;

3. Elemental analysis of geological and mineral samples;

4. Heavy metal element detection in environmental samples;

5. Construction of teaching and scientific research experimental platforms for universities.

V. Typical Models and Application Types

The picture shows the test effect of the AiboNa X-ray fluorescence spectrometer

Appearance drawing