1. Product Introduction
The Abner E2 Fiber-Coupled Optoelectronic Test Probe Station is a compact integrated optoelectronic test platform designed for semiconductor devices, two-dimensional materials and optoelectronic functional devices. The system deeply integrates highly stable electrical probe testing with fiber-coupled optical excitation/collection, enabling multi-physics field collaborative characterization of devices under optical excitation, electrical bias and microscopic observation conditions. Adopting a high-rigidity platform structure and modular design concept, the E2 supports multi-probe electrical testing and reserves standard fiber interfaces for easy connection to lasers, broadband light sources, spectrometers or optical power meters. It meets experimental requirements such as photocurrent measurement, photoresponse testing, I–V / C–V characterization and light-modulated electrical transport studies. Featuring a compact structure and intuitive operation, the instrument is particularly suitable for fundamental research and device validation of optoelectronic devices in university laboratories and research institutes.
II. System Features and Advantages
(1) Integrated fiber coupling design
Supports multiple standard fiber interfaces with stable light source coupling and good repeatability, suitable for laser or broadband illumination experiments.
(2) Stable and reliable probe test structure
Adopts a high-rigidity base and low-drift stage design to ensure stability during long-duration tests.
(3) High-precision probe manipulation capability
Equipped with XYZ fine-tuning structure for probes, enabling independent adjustment of multiple probes with precise needle landing and high repeatability.
(4) Microscopy-friendly design
Can be fitted with a long-working-distance microscope system to support coaxial or oblique observation and improve alignment efficiency.
(5) Strong modular expandability
Electrical instruments, optical modules and the number of probes can be flexibly configured according to experimental requirements.
III. Technical Specifications
(1) Mechanical and Platform Parameters
Probe Station Type: Fiber-coupled optoelectronic test probe station
Platform Structure: High-rigidity vibration-damping structure
Sample Stage Size: ≤ 4 inches (customizable)
Sample Stage Travel: X/Y: ≥ 25 mm; Z: ≥ 10 mm; Sample Holding Method: Vacuum adsorption / mechanical clamping (optional)
(2) Probe System
Number of Probes: 2–4 sets (expandable); Probe Adjustment: XYZ three-dimensional fine adjustment; Minimum Adjustment Resolution: ≤ 5 μm; Probe Compatibility: DC probes; high-frequency probes (optional); Probe Interface: Standard coaxial / triaxial interface; Fiber Coupling and Optical Parameters
Fiber Connector Type:
FC / PC, FC / APC (optional)
Fiber Fixing Method: Three-dimensionally adjustable fiber coupling bracket
Light Spot Adjustment: Fine adjustment of focal length and position supported
Compatible Light Sources: Semiconductor lasers, supercontinuum light sources, LEDs / halogen lamps; Optical Expansion: External connection to spectrometers and optical power meters available
(3) Microscopic Observation System (Optional)
Microscope Type: Long working distance microscope
Magnification: 10× – 100× (optional)
Observation Modes: Coaxial illumination; oblique illumination; Imaging Interface: C-Mount, camera optional
(5) Electrical Test Compatibility
Supported Test Types:
I–V characteristic test; photocurrent test; photoresponse / optical switching characteristics; C–V (optional)
External Instruments: Source meters, LCR meters, low-noise amplifiers
(6) Typical Application Fields
Semiconductor optoelectronic devices (photodiodes, detectors); optoelectronic transport testing of two-dimensional materials; photocurrent microscopy and localized photoexcitation experiments; evaluation of novel optoelectronic functional material devices; comprehensive optoelectronic experimental platform for teaching and scientific research.
Product Structure Diagram
