I. Product Overview
ABONA CT Series Mid-Range Probe Station is a dual-purpose probe test platform for research and engineering, developed to fulfill the testing demands of semiconductor devices, two-dimensional materials, MEMS and sensors. It integrates a stable mechanical framework, precise probe manipulation module, microscopic observation system and multi-interface electrical testing functions, achieving an optimal balance among performance, expandability and cost.
Targeted as the primary equipment for university research labs and routine platform for corporate R&D departments, the CT Series can conduct standard basic electrical tests such as I-V, C-V and four-probe measurements, and also support low-noise testing and multi-probe collaborative testing. It is an ideal upgrade solution replacing entry-level probe stations.
II. Product Features & Advantages
1. Mid-Range Positioning with Balanced Performance and Cost
Compared with basic entry-level probe stations, the CT Series realizes overall upgrades in structural stability and manipulation precision. When matched against high-end integrated platforms, it adopts streamlined configurations with more affordable procurement and maintenance costs.
2. Stable and Reliable Mechanical Structure Design
Equipped with a high-rigidity base and chuck stage to reduce mechanical drift during probe contact. The long-travel XY stage adapts to multi-device and multi-point testing scenarios.
3. Precision Probe Manipulation System
The probe manipulator supports fine XYZ three-axis adjustment with smooth probe movement and outstanding repeat positioning consistency; simultaneous alignment and testing of multiple probes are available.
4. High-Efficiency Microscopic Observation and Alignment
Compatible with long working distance microscopes; coaxial or tilted observation modes are optional to improve probe landing success rate.
5. Excellent Compatibility with Electrical Test Equipment
Standard-equipped with BNC ports for general electrical testing; optional Triax low-noise ports support ultra-low current measurement. It is fully compatible with mainstream source meters, LCR meters and comprehensive test systems.
III. Typical Application Scenarios
Room-temperature electrical testing of discrete semiconductor devices and simple integrated devices;Transport property characterization of two-dimensional material devices (Graphene, MoS₂, WSe₂, etc.);Resistance, capacitance and stability analysis of MEMS and sensor components;Daily probe testing experiments for enterprise R&D and university scientific research.
IV. Technical Specifications
4.1 Probe Station and Mechanical Platform
Repositioning Accuracy
| Project | Technical Parameters |
|---|
| System Type | Mid-range Manual Probe Station |
| Sample Size | Chip-level samples (2–4 inch support optional) |
| Stage travel range | XY：≥ 50 mm × 50 mm；Z：≥ 10 mm |
| Displacement Resolution | ≤ 1 μm（Fine-tuning） |
| ≤ ±2 μm（typical） |
|
| Maximum sample height | ≤ 25 mm |
| Stage Type | Flat specimen stage (vacuum adsorption optional) |
4.2 Probe Manipulation System
| Project | Technical Parameters |
|---|
| Number of probe manipulators | 4–6 pieces (expandable to 8) |
| Probe adjustment method | XYZManual fine-tuning |
| Optional Functions | θ Rotation / Probe Swing Angle Adjustment |
| Probe Type | DC Soft cannula / Hard needle |
| Contact Stability | Low drift during long-duration testing with excellent repeatability |
4.3 Microscopy and Observation System (Optional)
Types of Microscopes
| Project | Technical Parameters |
|---|
| Long Working Distance Optical Microscope |
|
| Observation method | Coaxial / Tilted Observation |
| Magnification | 50× – 500×（typical） |
| Imaging Interface | USB / HDMI Camera Interface (Optional) |
4.4 Electrical Interfaces and Testing Capabilities
| Project | Technical Parameters |
|---|
| Support testing | I-V / C-V / Four-probe / Leakage Current Test |
| Interface format | BNC（Standard configuration） |
| Optional Interfaces | Triax（Low Current Test） |
| Current magnitude | Determined by external instruments (supports fA-level systems) |
| Instrument Compatibility | Keithley / Keysight and other mainstream testing instruments |
4.5 System Specifications
| Project | Technical Parameters |
|---|
| Control Mode | Fully manual operation |
| Power Supply Requirements | AC 220 V，50 Hz |
| Working environment | 15–30 ℃，30–70% RH |
| Safety Design | Mechanical Limit / Ground Protection |
V. Positioning of CT Series Products (for your matrix compilation)
Mid-range research probe station (ambient temperature + standard electrical testing); increased probe count + low-noise Triax ports + upgraded microscopy; vacuum chuck / heating stage / expandable electrical ports.
