I. Product Overview
The Aibona C-Series Comprehensive Analysis Probe Station Test System is a general-purpose electrical measurement platform designed for semiconductor devices, two-dimensional materials, MEMS and sensor devices. It integrates precision probe manipulation, stable sample mounting, microscopic observation and multi-interface electrical testing functions, to fulfill research and teaching requirements ranging from basic I–V / C–V measurements to multi-probe and low-noise analysis.Guided by the core design philosophy of stable structure, intuitive operation, flexible configuration and high cost performance, the C-Series is suitable for university laboratories, research institutes and corporate R&D departments. It can serve as a daily device testing platform, as well as a basic expansion unit for integrated test systems.
II. System Features & Advantages
Integrated Probe Test PlatformSupports standard I–V, C–V, four-probe, leakage current and breakdown voltage measurements. Multi-channel probe layout accommodates multi-port testing of devices.
Stable and Reliable Mechanical StructureHigh-rigidity base and platform design reduces positional drift during measurements. Manual coarse and fine adjustment mechanisms enable intuitive operation and easy maintenance.
Precision Probe Manipulation3-axis (XYZ) fine adjustment for probes, supporting synchronous alignment of multiple probes. Compatible with various DC probes and low-noise test cables.
Optimized Microscopic Observation and AlignmentConfigurable long-working-distance microscope system; supports coaxial and tilted viewing modes to improve probe placement efficiency and measurement repeatability.
Modular Design for Easy UpgradesElectrical interfaces, probe quantities and sample stage types can be customized as required. Seamless integration with mainstream source meters, LCR meters and low-noise amplifiers.
III. Typical Application Fields
Room-temperature electrical characterization of discrete semiconductor devices and integrated devices
Characteristic testing of two-dimensional material devices (Graphene, TMDs)
Resistance, capacitance and stability analysis of MEMS / sensor devices
Basic electrical device testing and demonstrations for teaching experiments
IV. Technical Parameters
4.1 Probe Station and Mechanical Platform
Probe Type
| project | Technical Indicators |
|---|
| System Type | Comprehensive Analysis Probe Station Test System |
| Sample Size | Chip-level samples (optional, compatible with sizes up to 2 inches) |
| Stage travel | XY：≥ 25 mm × 25 mm；Z：≥ 10 mm |
| displacement resolution | ≤ 1 μm（fine-tuning） |
| Repeat Positioning Accuracy | ≤ ±2 μm（typical） |
| Repeat Positioning Accuracy | 4–8 个（Standard 8-probe layout） |
| Probe Manipulation Method | XYZ Manual fine-tuning (optional θ rotation/tilt angle)） |
| DC flexible probe / rigid probe (low-noise probe optional) |
|
| Maximum Sample Height | ≤ 20 mm（typical） |
4.2 Microscopy and Observation System (Optional)
| project | technical indicators |
|---|
| Microscopic System | Long Working Distance Optical Microscope |
| Observation method | Coaxial / Tilted Observation (Optional) |
Magnification| 50× – 500×（typical） |
|
| Imaging Interface | Camera Interface (USB/HDMI, Optional) |
4.3 Electrical Testing and Interfaces
| project | technical indicators |
|---|
| Supported Test Types | I–V / C–V / Four-Probe / Leakage Current Test |
| Interface form | BNC（Standard configuration) |
| Optional Interface | Triax（Low Current Test） |
| Current testing capability | Depends on external instruments (systems supporting fA level) |
| Instrument Compatibility | Keithley、Keysight mainstream source meters and LCR meters |
4.4 System Specifications
| project | technical indicators |
|---|
| Control Mode | Manual operation + external instrument control |
| Power Supply Requirements | AC 220 V，50 Hz |
| working environment | 15–30 ℃，30–70% RH |
| safety design | mechanical limit / earthing protection |
V. Positioning Description of Series C (for your reference in building the product matrix)
Basic comprehensive analysis probe station (air environment, room-temperature electrical testing); expandable probe count + low-noise interface + upgraded microscopy system; heating stage / vacuum chamber / automated test interface (optional)
