
Abner MX Small System Microscope is a high-performance microscopic imaging system designed for research laboratories, education and teaching, and industrial inspection. It features a compact overall structure and simple operation, enabling quick switching of observation modes and smooth transition from macro to micro views. Equipped with a high-definition digital display module and an expandable camera interface, it can meet users' multi-level requirements for imaging quality, operational efficiency and result recording. The system is suitable for daily laboratory sample observation, and can also work with AI image analysis software for batch measurement and analysis, greatly improving research efficiency.
I. Technical Parameters
| Parameter classification | Specification |
|---|---|
| Product Name | Abner MX Small System Microscope |
| Model / Series | MX Series (customizable with different configuration versions) |
| optical system | High-Resolution Infinite Apochromatic Optical Design |
| magnification | 40× ~ 1000×(Optional according to the objective lens combination) |
| 4× / 10× / 20× / 40× / 60× / 100×(Optional) | |
| Eyepiece Specification | 10× / 15×Wide-field eyepiece |
| Wide-field design increases the observation range | |
| Field of view width | LED adjustable brightness transmitted illumination + reflected illumination |
| Coaxial coarse/fine focusing, highly stable and wobble-free design | |
| Digital display | High-definition screen (touchscreen / external display optional) |
| Image acquisition | Compatible with USB3.0 high-definition industrial camera |
| Software support | Image acquisition, measurement, annotation and batch processing software |
| HDMI / USB / Network (depending on specific configuration) | |
| Power supply | 100–240 V AC Globally applicable |
| Dimensions and Weight | Compact design for easy placement and movement on the desktop |
II. Functional Features
(1) Excellent Optical Performance
High-quality infinity-corrected achromatic lenses deliver clear imaging without chromatic aberration.
Wide-field eyepieces expand the overall observation range.
(2) Digitization & Intelligent Operation
Supports real-time image capture, storage and measurement.
Combined with software, it enables automatic multi-parameter measurement including length, angle and area.
(3) Multi-scenario Application
Laboratory research observation; teaching demonstration; surface quality inspection in industry; observation of biological slices and mineral samples

Company Address:
Huai'an (Headquarters): No. 7, Meigao Road, Qingpu Industrial Park, Qingjiangpu District, Huai'an City, Jiangsu Province
Suzhou: 4th Floor, Building D, China-Netherlands Innovation Harbor, No. 588 Xiangrong Road, Beihejing Sub-district, Xiangcheng District, Suzhou City, Jiangsu Province
Email:service@abner-nano.com
Contact Number: 13327968688 Mr. Yan

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