
# 1. Product Overview
The Aibona IC series inverted metallurgical microscope is designed for application scenarios such as semiconductor materials, metallic materials, precision machining and failure analysis. Adopting an inverted structure paired with long-working-distance metallurgical objectives, it supports multi-mode observation including brightfield, darkfield, polarized light and optional DIC for opaque samples. Featuring high stability and expandability, the system is compatible with modules for image acquisition, measurement and analysis, autofocus and motorized stages. It meets the observation requirements of research laboratories and industrial quality inspection for microscopic defects, grain structures, coatings and films, solder joints and packaging structures.
II. Typical Applications
Semiconductors: Wafer/chip packaging, solder joints and bonding, metal interconnections, scratch/particle/contamination inspection
Metallic Materials: Grain size, inclusions, heat-treated microstructures, fracture surfaces and failure analysis
Precision Manufacturing: Tool wear, microholes/microcracks, coating thickness and surface defects
FPD/Optoelectronic Devices: ITO/metal electrodes, local defects, surface topography and machining marks
III. Core Features
Inverted structure better suited for industrial samples: Samples can be placed more stably, facilitating observation of large/thick workpieces and reducing costs for sample flipping and clamping.
Metallurgy-specific illumination and imaging optimization: Modular design of transmitted and reflected illumination improves contrast and detail rendering for metallic/opaque samples.
Scalable multiple observation modes: Brightfield comes as standard; darkfield/polarized light/DIC are optional to meet diverse metallographic analysis requirements.
Open interface ecosystem: Compatible with cameras, measurement software and third-party image analysis tools; expandable with motorized stages, encoders, autofocus and more.
Long-term stability and easy maintenance: High-rigidity design for key components with reproducible optical path and mechanism adjustments, ideal for frequent quality inspection operations.
III. Technical Specifications (General Specifications for IC Series, adjustable according to model/configuration)
1) Optical System
Optical System: Infinity-corrected metallurgical optical system
Observation Tube: Trinocular observation tube (binocular viewing + camera port), 30° inclination (typical)
Field Number: FN 22 (typical; FN 20 / FN 22 available depending on configuration)
Eyepiece: 10×/22 (standard); optional 10×/20, 15×/16, micrometer eyepiece, etc.
2) Objective System (Metallurgical Long Working Distance)
Objective Type: LMPL / Plan metallurgical long working distance objective
Standard Magnification Combination (example): 5×, 10×, 20×, 50× (100× dry objective optional)
Objective Revolver: 5-hole / 6-hole metallurgical turret (matches configuration)
Optional Functions: Polarizing objective compatibility, DIC objective/prism assembly (on demand)
3) Observation Modes (Modular)
Standard: Reflected Brightfield (BF)
Optional: Darkfield (DF), Polarization (POL), DIC Differential Interference Contrast, simple coaxial illumination / high-contrast illumination solutions
4) Illumination System
Reflected Illumination: High-brightness LED reflected illumination with continuously adjustable brightness
Color Temperature: Typical 5500K (or described as "white light LED")
Optional: Halogen illumination solution (preferred by some customers for continuous spectrum)
Optical Path: Equipped with field diaphragm / aperture diaphragm (subject to configuration)
5) Stage and Focusing Mechanism
Stage: Large-size mechanical moving platform (X/Y), supporting rapid positioning and fine movement
Travel range: Typical X 200–250 mm, Y 150–200 mm (confirmed according to actual structure)
Z-axis focusing: Coaxial coarse/fine focusing
Fine adjustment accuracy: 0.002 mm (2 μm, typical)
Optional: Motorized stage (X/Y/Z), closed-loop encoder readout, autofocus module
6) Imaging and Interfaces
Camera mount: C-mount (0.5×/0.63×/1× optional)
Camera compatibility: USB3.0 industrial cameras (8.3MP/12MP/16MP optional recommended)
Software functions (optional): Photo/video capture, calibration measurement, scale/angle/area measurement, depth-of-field composition, image stitching, report export
7) System Specifications and Application Conditions
Operation mode: Laboratory / production line quality inspection
Power supply: AC 220V, 50/60Hz
Operating environment: Temperature 15–30°C; Humidity 30–70% (no condensation)
Reliability: Suitable for long-duration continuous operation ("Industrial-grade heat dissipation and lifespan design" can be stated in the proposal)
Observe the figure


Company Address:
Huai'an (Headquarters): No. 7, Meigao Road, Qingpu Industrial Park, Qingjiangpu District, Huai'an City, Jiangsu Province
Suzhou: 4th Floor, Building D, China-Netherlands Innovation Harbor, No. 588 Xiangrong Road, Beihejing Sub-district, Xiangcheng District, Suzhou City, Jiangsu Province
Email:service@abner-nano.com
Contact Number: 13327968688 Mr. Yan

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