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艾博纳微纳米科技(江苏)有限责任公司

Eall:service@abner-nano.com

Contact Number: 13327968688  Mr. Yan

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Company Address:Huai'an (Headquarters): No. 7 Meigao Road, Qingpu Industrial Park, Qingjiangpu District, Huai'an City, Jiangsu ProvinceSuzhou: 4th Floor, Building D, China-Netherlands Innovation Hub, No. 588 Xiangrong Road, Beihejing Sub-district, Xiangcheng District, Suzhou City, Jiangsu Province

Dongguan: Room 4216, 42nd Floor, Dongjiang Star Commercial Building, Dongguan City, Guangdong Province


ICSeries Inverted Metallurgical Microscope

ICSeries Inverted Metallurgical Microscope

  • Category:Upright / Inverted / Biological Microscope
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  • Release time:2026-02-03 19:01:14
  • Product description

ABN-IMM-001倒置金相显微镜-1




# 1. Product Overview

The Aibona IC series inverted metallurgical microscope is designed for application scenarios such as semiconductor materials, metallic materials, precision machining and failure analysis. Adopting an inverted structure paired with long-working-distance metallurgical objectives, it supports multi-mode observation including brightfield, darkfield, polarized light and optional DIC for opaque samples. Featuring high stability and expandability, the system is compatible with modules for image acquisition, measurement and analysis, autofocus and motorized stages. It meets the observation requirements of research laboratories and industrial quality inspection for microscopic defects, grain structures, coatings and films, solder joints and packaging structures.



II. Typical Applications


Semiconductors: Wafer/chip packaging, solder joints and bonding, metal interconnections, scratch/particle/contamination inspection


Metallic Materials: Grain size, inclusions, heat-treated microstructures, fracture surfaces and failure analysis


Precision Manufacturing: Tool wear, microholes/microcracks, coating thickness and surface defects


FPD/Optoelectronic Devices: ITO/metal electrodes, local defects, surface topography and machining marks


III. Core Features


Inverted structure better suited for industrial samples: Samples can be placed more stably, facilitating observation of large/thick workpieces and reducing costs for sample flipping and clamping.


Metallurgy-specific illumination and imaging optimization: Modular design of transmitted and reflected illumination improves contrast and detail rendering for metallic/opaque samples.


Scalable multiple observation modes: Brightfield comes as standard; darkfield/polarized light/DIC are optional to meet diverse metallographic analysis requirements.


Open interface ecosystem: Compatible with cameras, measurement software and third-party image analysis tools; expandable with motorized stages, encoders, autofocus and more.


Long-term stability and easy maintenance: High-rigidity design for key components with reproducible optical path and mechanism adjustments, ideal for frequent quality inspection operations.


III. Technical Specifications (General Specifications for IC Series, adjustable according to model/configuration)


1) Optical System


Optical System: Infinity-corrected metallurgical optical system


Observation Tube: Trinocular observation tube (binocular viewing + camera port), 30° inclination (typical)


Field Number: FN 22 (typical; FN 20 / FN 22 available depending on configuration)


Eyepiece: 10×/22 (standard); optional 10×/20, 15×/16, micrometer eyepiece, etc.


2) Objective System (Metallurgical Long Working Distance)


Objective Type: LMPL / Plan metallurgical long working distance objective


Standard Magnification Combination (example): 5×, 10×, 20×, 50× (100× dry objective optional)


Objective Revolver: 5-hole / 6-hole metallurgical turret (matches configuration)


Optional Functions: Polarizing objective compatibility, DIC objective/prism assembly (on demand)


3) Observation Modes (Modular)


Standard: Reflected Brightfield (BF)


Optional: Darkfield (DF), Polarization (POL), DIC Differential Interference Contrast, simple coaxial illumination / high-contrast illumination solutions


4) Illumination System


Reflected Illumination: High-brightness LED reflected illumination with continuously adjustable brightness


Color Temperature: Typical 5500K (or described as "white light LED")


Optional: Halogen illumination solution (preferred by some customers for continuous spectrum)


Optical Path: Equipped with field diaphragm / aperture diaphragm (subject to configuration)


5) Stage and Focusing Mechanism


Stage: Large-size mechanical moving platform (X/Y), supporting rapid positioning and fine movement


Travel range: Typical X 200–250 mm, Y 150–200 mm (confirmed according to actual structure)


Z-axis focusing: Coaxial coarse/fine focusing


Fine adjustment accuracy: 0.002 mm (2 μm, typical)


Optional: Motorized stage (X/Y/Z), closed-loop encoder readout, autofocus module


6) Imaging and Interfaces


Camera mount: C-mount (0.5×/0.63×/1× optional)


Camera compatibility: USB3.0 industrial cameras (8.3MP/12MP/16MP optional recommended)


Software functions (optional): Photo/video capture, calibration measurement, scale/angle/area measurement, depth-of-field composition, image stitching, report export


7) System Specifications and Application Conditions


Operation mode: Laboratory / production line quality inspection


Power supply: AC 220V, 50/60Hz


Operating environment: Temperature 15–30°C; Humidity 30–70% (no condensation)


Reliability: Suitable for long-duration continuous operation ("Industrial-grade heat dissipation and lifespan design" can be stated in the proposal)


Observe the figure

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Company's main business: scientific research instruments, high-end microscopic equipment and transfer equipment.

Contact Us

Company Address:

Huai'an (Headquarters): No. 7, Meigao Road, Qingpu Industrial Park, Qingjiangpu District, Huai'an City, Jiangsu Province

Suzhou: 4th Floor, Building D, China-Netherlands Innovation Harbor, No. 588 Xiangrong Road, Beihejing Sub-district, Xiangcheng District, Suzhou City, Jiangsu Province

Email:service@abner-nano.com

Contact Number: 13327968688  Mr. Yan

              

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