I. Product Overview

      Abner CT High-Low Temperature Probe Station delivers precise temperature control and reliable testing performance. Specially designed for high-precision thermal testing requirements, it is widely adopted for performance characterization of materials and devices, supporting electrical and thermal tests in the fields of semiconductors, MEMS, optoelectronic devices and more.

        The equipment features a broad temperature range from -190°C to +300°C, and enables testing under atmospheric pressure, vacuum and inert gas environments, ensuring stable and accurate test results even under extreme temperature conditions.

Technical Parameters

II. Functional Features

1. Wide-range temperature control capability: Supports continuous adjustable temperature from low to high temperature to meet the testing requirements of various materials and devices.

2. High-stability temperature-controlled stage: The sample chuck delivers excellent temperature uniformity with minor temperature fluctuations to guarantee reliable test results.

3. Precision XYZ motion stage: Enables high-precision alignment and repeat positioning of samples and probes under various temperature conditions.

4. Multi-probe configuration support: Allows synchronous testing with single or multiple probes, suitable for complex device structures.

5. Compatible microscopic observation system: Matches with stereomicroscopes or metallurgical microscopes to realize real-time observation.

6. Safety and protection design: Equipped with over-temperature protection and system interlocks to secure equipment and samples.

III. Application Scenarios & Fields

1. I-V, C-V and reliability testing of semiconductor devices under high and low temperature conditions.

2. Temperature-dependent performance and functional testing of MEMS devices.

3. Research on low-temperature transport and high-temperature stability of two-dimensional material devices.

4. Electrical characteristic characterization of novel functional materials under variable temperature environments.

5. Construction of variable-temperature electrical test platforms for universities and research institutes.

IV. Technical Advantages

1. Combination of wide temperature range and stable temperature control improves the credibility of test data. Equipped with a high-performance temperature control system, this high-low temperature probe station realizes stable temperature regulation of samples across a wide temperature span, effectively reducing the impact of temperature fluctuations on test results, and is ideal for research on temperature-sensitive devices.

2. Deep integration of temperature control system and probe testing. The structural design fully coordinates temperature control and probe manipulation. Stable contact between probes and samples can be maintained under various temperature conditions, boosting test repeatability and experimental efficiency.

3. Precision motion mechanism guarantees positioning accuracy under high and low temperatures. The stage maintains excellent mechanical stability and positioning accuracy even during temperature variations, satisfying the testing requirements of micro-nano scale devices.

4. Compatibility with multi-probe and multi-interface setups delivers flexible application. It supports various probe configurations and electrical interfaces, and can be matched with multiple types of test instruments and experimental schemes.

5. Suitable for long-term stable operation in scientific research and engineering verification. The material selection and structural design balance high-low temperature adaptability and reliability, meeting the long-term operation demands of laboratory research and engineering testing.

Application Cases

Device appearance drawing