The EMPXH probe station manufactured by ABN (Aibona) is equipped with an electromagnet delivering an in-plane horizontal magnetic field of ±0.6 T. It supports all standard C-V, I-V, microwave and electro-optic probing, as well as in-plane horizontal magnetic field electromagnetic measurements. Researchers can utilize the EMPXH to characterize magnetic transport parameters and conduct ST-FMR tests, among other experiments. It is a cryogenic probe station from Lake Shore series dedicated to vector-dependent magnetic transport measurements.
To maximize the magnetic field applied to samples, the EMPXH features a 30° tilted probe setup, compatible with wafer specimens up to 25 mm (1 inch) in diameter. An optional 360° rotatable sample stage enables characterization of angle-dependent and anisotropic magnetic transport properties. The EMPXH operates within a temperature range of 4.5 K to 400 K; a cryogenic upgrade option extends the base minimum temperature down to 3.2 K. Adopting continuous-flow refrigeration technology, the system can be cooled by either liquid helium or liquid nitrogen.
Minimum temperature: 1.8 K (standard configuration), liquid-helium-free operation from room temperature down to cryogenic temperature
Magnetic field range: ±2 T electromagnet as standard; optional ±9 T superconducting magnet, magnetic field homogeneity <0.5%
Compatible samples: 2/4-inch wafers, bulk/thin-film samples with diameter ≤ 50 mm
Vacuum level: <1×10⁻⁶ Torr (high-vacuum chamber)
Probe arms: 4-channel DC probe arms standard; optional 2-channel RF/microwave probe arms (up to 110 GHz)
II. Main Parameters and Descriptions
| Magnet Type | Electromagnet |
| magnetic field direction | Horizontal direction (parallel to the sample surface) |
| Magnetic Field Control | The Hall probe is installed inside the probe station for closed-loop magnetic field control |
| Magnetic field magnitude | maximum±6koe(±0.6T) |
| Magnetic field uniformity | 0.6%10mmDiameter; 2.6%25mm diameter |
| Probe tip movement | <5umWithin the entire magnetic field range |
| Temperature range | |
| A maximum of 4 probe arms can be installed | Base temperature 4.5K, controlled temperature range 5K~400K |
| Install the PS-LT low-temperature accessory | Base temperature: 3.2 K, controlled temperature range: 3.3 K ~ 400 K |
| Temperature stability | liquid helium liquid nitrogen |
| Base temperature | ±20mk ±50mk |
| Take the TPS-FRG molecular pump as the standard | |
| Pump-down time | 30min(<1x10﹣3Torr) |
| room temperature | <5X10﹣4Torr |
| Base temperature | <1X10﹣5Torr |
| Maximum temperature | <5X10﹣3Torr |
| Cycle Time | |
| Main Loop | 3h |
| vacuum pumping | 0.5h |
| Probe station cooling | 1.25h |
| Probe station heating up | 1.25h |
| Sample | |
| Maximum size | 51mm(2inch) |
| Sample backlight interface | Not selectable |
| Sample rotation | 360°Sample rotation accessory(PS-360-EMPX) |
| Sample vibration | <300nmStandard |
| Probe Configuration | |
| Maximum number of probes | 4 |
| Used to monitor the temperature of the probe arm | |
| Cooling probe bracket | <20K(The sample is under the base temperature) |
| Probe bracket | Connect the sample stage heat sink |
| Probe Arm Bracket Connects Radiation Shield Heat Sink | |
| DC/RFprobe Electrical insulation > 100 GΩ for floor drain point measurement | |
| Microwave Probe Frequency range from DC to 67 GHz | |
| Fiber Optic Probe Can be used for electro-optic measurement | |
| Needle drop range All probes can perform needle drop within a circle with a diameter of 25.4 millimeters (one inch) |
Dual-stage closed-cycle refrigerator enables continuous temperature adjustment from 1.8 K to 400 K; cooling time from room temperature to 1.8 K is less than 4 hours. The sample stage and probe arms adopt an isothermal design to eliminate measurement errors induced by temperature gradients, supporting stable long-term unattended operation.
Built-in magnetic field module with selectable vertical or horizontal field orientations. The magnetic field sweep rate is precisely adjustable from 0.001 T/min to 1 T/min. Independent control of magnetic field and temperature field eliminates mutual interference, catering to variable-field and variable-temperature measurements for magnetoelectric coupling and spintronics research.
Standard dual optical alignment system combining metallurgical and fluorescence microscopy with magnification ranging from 50× to 1000×, delivering micron-level visual positioning. 3D precision adjustment of probe arms achieves ±0.5 μm positioning accuracy, with expandability up to 6 probe arms, compatible with diverse measurement methods including four-point probe and differential probing.
Natively supports DC measurements (current, voltage, resistance), Hall effect, I-V and C-V characterization. Optional RF/microwave module enables S-parameter and noise figure testing up to 110 GHz. An integrated optoelectronic module is available to conduct photoelectric response and fluorescence spectrum measurements under low-temperature magnetic field environments.
High-vacuum chamber effectively suppresses sample oxidation and thermal convection interference. Integrated vibration isolation and electromagnetic shielding inside the chamber reduce vibration to less than 0.1 μm along X/Y/Z axes and cut electromagnetic noise, ensuring accurate acquisition of weak signals such as tunneling current from quantum devices.
All-in-one industrial control software allows synchronous configuration of temperature parameters (target temperature, ramp rate), magnetic field parameters (magnitude, orientation, sweep rate) and probe positioning settings. It supports real-time acquisition, storage and export of test data, and is compatible with secondary development via LabVIEW.
Quick-opening vacuum chamber facilitates rapid sample replacement; the refrigerator is consumable-free and only requires routine maintenance. On-site upgrades are available for probe arms, magnetic field modules and RF modules without complete system reconstruction, accommodating evolving measurement requirements of various research projects.
The EMPXH probe station supports characteristic characterization of various micro-nano devices and materials under combined low-temperature and magnetic field environments. It is primarily applied to cutting-edge scientific research and high-end device R&D. Detailed application scenarios and fields are listed below:
Low-temperature magnetoelectric characterization of quantum dots, superconducting quantum bits, topological quantum devices and Majorana zero modes; investigate how magnetic fields regulate quantum coherence time, energy level transitions and tunneling effects. It serves as a critical test platform for quantum computing chip development.
Low-temperature magnetoelectric coupling characterization of multiferroic materials, topological insulators, ferromagnetic/antiferromagnetic magnetic thin films, and spin-valve devices. Conduct measurements of Hall effect, anomalous Hall effect, spin Hall effect, and magnetoresistance properties including Giant Magnetoresistance (GMR) and Tunnel Magnetoresistance (TMR).
Low-temperature magnetic field testing of I-V/C-V curves, high-frequency performance and reliability for wide-bandgap semiconductor devices such as GaN/AlN/GaAs-based HEMTs, MOSFETs and FinFETs. Identify the influence of magnetic fields on carrier mobility, threshold voltage and noise figure of devices.
Low-temperature magnetic transport characterization of two-dimensional materials including graphene, MoS₂, MXene and heterojunctions. Measure carrier concentration, mobility and quantum Hall effect; study the modulation mechanism of magnetic fields on the electronic structure of low-dimensional materials.
Low-temperature magnetic field optoelectronic response testing for infrared photodetectors, quantum dot lasers and perovskite photovoltaic devices. Verify how magnetic fields affect the separation, transport and recombination efficiency of photogenerated carriers, so as to optimize device optoelectronic performance.
Fundamental research and project tackling in microelectronics, condensed matter physics, materials science, magnetism and other disciplines. Suitable for shared use among multiple research groups, meeting diversified experimental demands for variable-temperature, variable-field and multi-type measurements.
Device appearance drawing


Company Address:
Huai'an (Headquarters): No. 7, Meigao Road, Qingpu Industrial Park, Qingjiangpu District, Huai'an City, Jiangsu Province
Suzhou: 4th Floor, Building D, China-Netherlands Innovation Harbor, No. 588 Xiangrong Road, Beihejing Sub-district, Xiangcheng District, Suzhou City, Jiangsu Province
Email:service@abner-nano.com
Contact Number: 13327968688 Mr. Yan

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