I. Product Overview

The CM Compact Manual Probe Station is a purely manual desktop device developed by ABN. It features no complex electronic control modules and mainly consists of precision manual probe arms, a basic optical alignment assembly, and a simple magnetic or vacuum sample stage.

It is suitable for ultra-small samples including wafers up to 1 inch, bare dies, miniature PCBs (≤50×50 mm), and tiny micro-nano devices, with a positioning accuracy of ±5 μm to meet the contact requirements for basic test points.

The station can be directly matched with common portable testing instruments such as multimeters, basic source meters and oscilloscopes to conduct tests including continuity, open/short circuit, DC resistance and fundamental I-V curves. Compact and lightweight with an affordable price, it requires no consumables for maintenance. It can be placed on ordinary desktops or lab benches without dedicated lab space or professional technicians, serving as a cost-effective option for basic testing scenarios.

II. Equipment Parameters

Z-axis adjustment of sample stage

Optional Accessories

Heating stage, monitor, adapter, RF test accessories, shielding box, optical platform, gold-plated chuck, optoelectronic test accessories

III. Core Functional Features

Ultra-Compact & Portable Design

Overall dimension: only 300×280×380 mm, net weight ≤15 kg, floor space less than 0.1 ㎡ when placed on a desktop. It can be moved and stored effortlessly, suitable for multi-station shared use in laboratories and rapid on-site testing.

Zero-Threshold Manual Operation

No electronic control system or software debugging required. Probe arms are purely mechanically fine-tuned with intuitive knob operation. New users can master basic alignment and testing within 10 minutes without prior training.

High Cost Performance & Low Overall Cost

Entry-level equipment procurement cost, far lower than standard precision probe stations. Consumable-free with zero post-operation maintenance fees, low failure rate and easy repair, ideal for budget-limited basic testing scenarios.

Clear & Reliable Basic Alignment

Standard stereo microscope with 20×–400× magnification delivers a clear field of view, enabling direct observation of contact status between probe tips and sample test points. It fully meets alignment demands for basic testing with no blind viewing zones.

Flexible Sample Fixation & Probe Configuration

Comes with a magnetic sample stage as standard to secure tiny samples rapidly and prevent sliding. 2 probe arms are equipped by default, expandable to 4 with simple upgrades. Compatible with universal pointed and spring test probes; probes can be replaced barehanded without tools.

Full Compatibility with Conventional Test Peripherals

No dedicated matching instruments required. It can directly connect to general test equipment including multimeters, basic source meters, handheld oscilloscopes and portable resistance meters with plug-and-play functionality for all types of basic electrical tests.

Robust & Durable for Multi-Scenario Deployment

The frame is constructed from engineering plastic and metal brackets, featuring drop and scratch resistance. The microscope is fitted with a dust-proof protective cover, supporting deployment in general laboratories, workshop incoming inspection zones, teaching benches and other environments.

Minimal Expandability

Optional upgrades include vacuum adsorption sample stage (for thin, warp-prone samples), 4-channel probe arm expansion kit and simple anti-collision protective cover. No complex modification is needed; modules can be installed on demand.

IV. Application Scenarios & Fields

The CM-4 compact probe station targets basic, simple and rapid testing requirements, excluding high-precision, high-frequency and complex parameter measurement scenarios. It is mainly applied for fundamental electrical performance verification, teaching training and rapid pre-screening, serving universities, small & medium enterprises and small laboratories. Detailed application scenarios and fields are as follows:

1. Basic Teaching & Training in UniversitiesUndergraduate lab teaching for majors such as Microelectronics, Electronic Information Engineering and Materials Science. It supports practical training for courses including Electronic Measurement Technology and Fundamentals of Semiconductor Devices, covering continuity and basic I-V tests of diodes/triodes, resistance measurement and open/short circuit detection of miniature PCBs. Students can intuitively master the basic principles and operation of probe testing.

2. Rapid Incoming & Sample Pre-Screening for SMEsIncoming quality control (IQC) and finished product pre-inspection for manufacturers of electronic components, miniature PCBs and microchips. It quickly verifies whether continuity and resistance of incoming devices meet standards, and detects open/short circuit defects on finished miniature PCBs. It eliminates the need for high-precision measurement, accelerates screening of qualified products and boosts efficiency of incoming and finished goods inspection.

3. Rapid Verification & Pre-Testing in LaboratoriesQuick pre-testing of samples in research labs and enterprise R&D departments. It conducts basic electrical performance verification on newly fabricated micro-nano devices and new material samples, rapidly judging sample continuity and baseline resistance compliance. Qualified samples are selected for subsequent high-precision characterization to save resources of high-end test equipment.

4. Small Component Inspection for Electronic Repair ShopsFault detection of microchips, flexible circuits and small electronic components from smartphones and wearable devices in small electronic repair stores. It quickly locates open/short circuits and abnormal resistance, supporting fast on-site maintenance without large professional equipment.

5. Vocational Skill Training for Technical CollegesSkill training for majors including Electronic Technology and Microelectronics Assembly. Trainees learn basic probe station operation and fundamental detection methods for electronic components, catering to vocational skill assessments and practical training, matching the basic testing demands of frontline manufacturing enterprises.

6. Pre-Screening of Mass Candidate Samples for Research ProjectsPreliminary basic electrical screening of large batches of candidate samples for research projects in universities and research institutes. Unqualified samples are eliminated quickly, and only a small number of high-quality specimens are sent to high-end test platforms for detailed characterization, drastically cutting project testing costs and lifting R&D efficiency.