I. Product Overview
The ABNER CX Closed-cycle Cryogenic Probe Station is a high-performance research-grade measurement platform designed for low-temperature electrical testing, quantum device characterization, 2D material research, and semiconductor device analysis.
Adopting a closed-cycle cryocooler solution, the system requires no liquid helium or liquid nitrogen refills, delivering a stable, repeatable cryogenic environment. It significantly reduces long-term operational costs while improving experimental safety and convenience. The system integrates a cryogenic vacuum environment, high-precision positioning stages, and multi-probe electrical measurement capabilities. It supports I-V, C-V, Hall, pulsed electrical, and multi-physics coupled measurements for discrete devices, chip-scale samples and small-format wafers under cryogenic conditions, and is widely used in university research institutes and advanced semiconductor laboratories.
II. Product Features & Advantages
Closed-cycle Cryogenic SystemEquipped with a high-reliability closed-cycle cryocooler; no liquid helium/liquid nitrogen consumption for low running costs; capable of long-duration continuous cryogenic testing
Precise Temperature Control over a Wide RangeCovers the full range from room temperature down to ultra-low temperatures; real-time monitoring via multiple temperature sensors; excellent temperature control stability with minimal temperature fluctuation
High-vacuum & Low-noise EnvironmentIntegrated vacuum chamber design; effectively suppresses thermal convection and moisture condensation; optimized mechanical and electromagnetic isolation to reduce measurement noise
High-precision Multi-axis Probe ManipulationXYZ micropositioning stages (θ axis optional); ultra-high probe positioning accuracy and repeatability; supports synchronous multi-probe measurements
High Expandability & CompatibilityCompatible with mainstream source meters, LCR meters and low-noise amplifiers; optional optical microscopy, magnetic field modules and RF test interfaces; customizable configurations to meet diverse research requirements
III. Typical Applications
I-V / C-V characterization of cryogenic transistors and semiconductor devices
Low-temperature transport property studies of 2D materials (Graphene, TMDs, hBN)
Electrical characterization of quantum devices and superconducting devices
Cryogenic Hall measurement and magneto-transport experiments
Low-temperature reliability analysis of advanced semiconductor materials
IV. Technical Specifications
| Item | Specification |
|---|
| Cooling Method | Closed-Cycle Cryocooler（Closed-Cycle Cryocooler） |
Temperature Range| ≤ 4 K（typical）～ 300 K |
|
| Temperature Stability | ≤ ±10 mK（at steady low temperature） |
| Cooldown Time | Room temperature to base temperature: ≤ 4–6 hours |
Vacuum Level| ≤ 1 × 10⁻⁵ Torr（typical） |
|
Sample Stage Size| ≤ 10 mm × 10 mm（customizable） |
|
| Sample Temperature Control | Direct sample stage temperature control + multi-point temperature monitoring |
| Number of Probes | 4–8 支（expandable） |
| Probe Type | DC / RF / low-noise soft probes |
| Displacement Resolution | ≤ 1 µm（XYZ fine adjustment)） |
| Displacement Resolution | Long working distance microscope (optional) |
Electrical Interfaces| BNC / Triax / SMA（per configuration） |
|
| Control Mode | PC software control + manual fine tuning |
| Operating Environment | 18–28 ℃，≤ 60% RH |
| Power Supply | AC 220 V，50 Hz |
V. Configuration & Customization Instructions
Compatible with magnetic field module expansion (horizontal / vertical configurations)
Support for RF / high-speed pulse test upgrades
Customizable wafer-style sample stages (2–4 inch)
Interfacing available with measurement systems including Keithley, Keysight, and Zurich Instruments
