I. Product Overview
The MTER 100 Micro-Spectroscopy Scanning Test System is an integrated micro-spectral analysis platform independently developed by Aibona Micro-Nano Technology. Integrating a microscopic imaging module, high-stability spectral detection unit, precision scanning stage and data analysis software, this system is applied to micro-area optical characterization and spectral scanning analysis for material science, semiconductor devices, biological specimens, two-dimensional materials and other fields.
Equipped with high numerical aperture microscopic objectives, the MTER 100 delivers micron-scale focusing. Combined with a high-resolution spectrometer and high-sensitivity detector, it enables simultaneous analysis of samples in both spatial and wavelength dimensions. The system supports point scanning, line scanning and area mapping modes, and can generate two-dimensional spectral distribution maps as well as quantitative analysis results of samples.
II. System Composition
Microscopic Imaging System (Bright field / Dark field optional)
High-Stability Spectral Detection Module
Precision 2D / 3D Motorized Scanning Stage
Multi-Band Light Source Module (Expandable)
Spectral Data Acquisition & Analysis Software
Vibration-Isolated Integrated Opto-Mechanical System
III. Technical Features
High Spatial Resolution for Micro-Area AnalysisHigh-NA objectives paired with precision optical path design achieve micron-scale spot size, suitable for analyzing 2D materials and micro-nano structured samples.
High Spectral Resolution DetectionAdopts high-throughput spectrometer architecture coupled with low-noise detectors to realize stable and repeatable spectral acquisition.
Automated Scanning & Mapping FunctionAllows custom step size and scanning area setup to reconstruct 2D maps of spectral intensity distribution, peak position distribution and multiple parameters.
Modular Expandable ArchitectureSupports expansion of light sources and detection modules across different wavebands, extendable to ultraviolet-visible-near infrared (UV-Vis-NIR) range.
Stable Mechanical StructureThe monolithic rigid frame of the whole system minimizes interference of environmental vibration on spectral signals.
IV. Technical Parameters (Standard Configuration)
| Project | Technical Parameters |
|---|
Spectral Range| 400 – 1000 nm（Scalable to 350 – 1700 nm） |
|
| Spectral Resolution | ≤ 0.2 – 0.5 nm（According to the grating configuration） |
| Spatial Resolution | ≤ 1 μm（Related to the numerical aperture (NA) of the objective lens） |
| Scan Mode | Point Scan / Line Scan / Area Scan（Mapping） |
| Minimum scanning step | 0.1 – 1 μm |
| Scanning Range | X-Y：50 mm × 50 mm（Customizable） |
| Z-axis travel | 10 – 20 mm |
| Objective lens magnification | 5× / 10× / 20× / 50× / 100× |
Numerical Aperture| 0.1 – 0.9 |
|
| Light source type | Broad-spectrum light source / Monochromatic laser (optional) |
| Detector Type | CCD / Cooled CCD / CMOS (optional) |
| Signal-to-Noise Ratio | ≥ 1000:1（Typical conditions） |
| Data output | Spectral Curve / 2D Mapping Plot / Peak Analysis Report |
| Control Mode | PCSoftware-controlled, supports automated scanning |
| Working environment | Temperature: 18–25℃, Humidity ≤60% |
| Power Requirements | AC 220V / 50Hz |
V. Typical Application Fields
Micro-area spectral analysis of two-dimensional materials (e.g., MoS₂, WSe₂, etc.)
Defect inspection of semiconductor devices
Band structure research of optoelectronic materials
Optical property characterization of micro-nano structures
Spectral component analysis of biological samples
Thin film uniformity and component distribution testing
VI. Summary of System Advantages
The MTER 100 Micro-Spectroscopy Scanning Test System strikes an effective balance between micro-area spatial resolution and spectral analysis capability, meeting both academic laboratory research and industrial testing requirements. Featuring a compact structure and intuitive operation, the system supports subsequent function expansion and hardware upgrades, catering to precision optical testing demands of university research institutes and corporate R&D departments.
