I. Product Introduction
The Abner MS High-Precision Photocurrent Scanning Test Microscope is developed to meet the research and development demands of semiconductors and optoelectronic devices. Integrating high-stability microscopic imaging, a precision scanning stage and low-noise photocurrent detection modules, it enables spatially resolved photocurrent imaging and quantitative analysis of devices at the micro-nano scale. The system supports multi-wavelength laser/white-light excitation, synchronous electrical acquisition and 2D/3D scanning imaging. It can intuitively reveal the local response, defect distribution and carrier transport properties of materials and devices, making it an ideal tool for universities and research institutes to conduct cutting-edge optoelectronic research and process evaluation.
## II. Technical Insights
1. Highly Stable Microscopic Optical System
Infinity-corrected optical path, supporting multi-mode extensions such as brightfield, darkfield and polarization. Combined high-NA objective lenses ensure micro-area excitation and high-contrast imaging. Coaxial or lateral incidence is optional to adapt to various device structures.
2. Precision Scanning and Positioning Stage
High-precision motorized X-Y-Z scanning with micron-level stepping and submicron repeatability.
Seamless switching between fast large-field scanning and local fine scanning.
Multi-specimen stages compatible with wafers, chips and custom samples.
3. Low-noise Photocurrent Detection Chain
High-sensitivity transimpedance amplification and low-noise front-end design. Wide-range current measurement (pA–mA range optional). Synchronous acquisition of position and electrical signals to realize pixel-level mapping.
4. Multi-source Excitation and Synchronous Control
Supports multi-wavelength laser/LED excitation with stable and adjustable power. Hardware-level synchronization of light source, scanning and acquisition to improve signal-to-noise ratio. Compatible with advanced measurement schemes such as lock-in detection (optional).
5. Professional Data and Software Platform
Real-time 2D/3D photocurrent imaging and overlay display. I-V, position-current curves and statistical analysis. Interfaces for data export and post-processing to facilitate research reproducibility and publication.
III. Typical Application Scenarios
Semiconductor optoelectronic devices: photodetectors, solar cells, LEDs/lasers
2D materials and heterojunctions: graphene, TMDs, van der Waals structures
Device defect and uniformity evaluation: local short circuits, interface states, non-uniform response
Process and mechanism research: carrier diffusion, interface recombination, photocurrent generation mechanism
IV. Summary of Product Advantages
High resolution × High sensitivity: balancing spatial resolution and current detection limit
Modular expansion: light sources, probes, detection hardware and software are upgradable
Research-grade stability: excellent consistency and repeatability for long-term scanning
Independently developed and controllable domestic technology: tailored to local research needs, fast response and flexible customization
